{"id":2408,"date":"2026-07-31T06:08:54","date_gmt":"2026-07-31T06:08:54","guid":{"rendered":"https:\/\/bingkunc17.sg-host.com\/?post_type=product&#038;p=2408"},"modified":"2026-09-28T08:10:47","modified_gmt":"2026-09-28T08:10:47","slug":"microscopio-acustico-de-barrido-estandar-sam","status":"publish","type":"product","link":"https:\/\/www.magntek.de\/es\/produkte\/standard-scanning-akustikmikroskop-sam\/","title":{"rendered":"Microscopio ac\u00fastico de barrido est\u00e1ndar (SAM)"},"content":{"rendered":"<table>\n<tbody>\n<tr>\n<td width=\"280\"><strong><b>Denominaci\u00f3n del par\u00e1metro<\/b><\/strong><\/td>\n<td width=\"330\"><strong><b>Valor de especificaci\u00f3n<\/b><\/strong><\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Dimensiones totales<\/b><\/strong><\/td>\n<td width=\"330\">1.070 mm \u00d7 950 mm \u00d7 1.500 mm<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>\u00c1rea de escaneo efectiva<\/b><\/strong><\/td>\n<td width=\"330\">400 mm \u00d7 320 mm (personalizable seg\u00fan las necesidades del cliente)<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Velocidad m\u00e1xima de escaneo<\/b><\/strong><\/td>\n<td width=\"330\">1.000 mm\/s<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Resoluci\u00f3n de imagen recomendada<\/b><\/strong><\/td>\n<td width=\"330\">1 \uff5e 4.000 \u03bcm\/p\u00edxel<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Ancho de banda de emisi\u00f3n y recepci\u00f3n de ultrasonidos<\/b><\/strong><\/td>\n<td width=\"330\">1 \uff5e 500 MHz<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Plataforma de tres ejes<\/b><\/strong><\/td>\n<td width=\"330\">Plataforma de granito, motores lineales de los ejes X e Y, doble accionamiento en el p\u00f3rtico<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Configuraci\u00f3n del cabezal de prueba<\/b><\/strong><\/td>\n<td width=\"330\">Configuraci\u00f3n individual, doble o de cuatro cabezales (opcional)<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Modo de escaneo<\/b><\/strong><\/td>\n<td width=\"330\">Escaneo C, escaneo B, escaneo A; compatible con el escaneo sincronizado C+T<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Sistema de suministro y desag\u00fce de agua<\/b><\/strong><\/td>\n<td width=\"330\">Entrada por presi\u00f3n de agua, salida por gravedad, salida opcional mediante bomba<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Dispositivo de sellado<\/b><\/strong><\/td>\n<td width=\"330\">Los dispositivos estancos pueden dise\u00f1arse a medida seg\u00fan las especificaciones del producto<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>","protected":false},"excerpt":{"rendered":"<ul>\n<li>Inspecci\u00f3n completa no destructiva: no se destruye la muestra, permite repetir la inspecci\u00f3n de forma eficaz y la pieza inspeccionada sigue siendo apta para su uso.<\/li>\n<li>Amplia banda de frecuencias de 1 a 500 MHz: baja frecuencia para una gran profundidad de penetraci\u00f3n y defectos profundos en m\u00f3dulos IGBT; alta frecuencia para una alta resoluci\u00f3n y microporos en paquetes de chips<\/li>\n<li>Esc\u00e1ner de delaminaci\u00f3n multicapa: admite hasta 1.000 escaneos de capas; adecuado para estructuras de encapsulado multicapa complejas<\/li>\n<li>Opciones de cabezales m\u00faltiples: configuraci\u00f3n de uno, dos o cuatro cabezales; los cabezales dobles a la izquierda y a la derecha duplican la eficiencia; la configuraci\u00f3n de cuatro cabezales permite un alto rendimiento<\/li>\n<li>Escaneo s\u00edncrono C+T: un \u00fanico escaneo proporciona simult\u00e1neamente im\u00e1genes en modo de reflexi\u00f3n (C-SAM) y en modo de transmisi\u00f3n (SAT)<\/li>\n<li>Plataforma de granito de bajas vibraciones, p\u00f3rtico con motor lineal y doble accionamiento; la precisi\u00f3n y la velocidad de escaneo son superiores a las de los sistemas cl\u00e1sicos de gu\u00edas lineales y husillos.<\/li>\n<\/ul>","protected":false},"featured_media":2409,"template":"","meta":{"_acf_changed":false},"product_brand":[],"product_cat":[15],"product_tag":[],"class_list":["post-2408","product","type-product","status-publish","has-post-thumbnail","product_cat-scanning-acoustic-microscope-sam-sat","first","instock","shipping-taxable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.5 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Standard-Scanning-Akustikmikroskop (SAM) | Magntek<\/title>\n<meta name=\"description\" content=\"Delaminationspr\u00fcfung an IGBT-\/SiC-Modulen, Chip-Packages &amp; K\u00fchlplatten. 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