{"id":2408,"date":"2026-07-31T06:08:54","date_gmt":"2026-07-31T06:08:54","guid":{"rendered":"https:\/\/bingkunc17.sg-host.com\/?post_type=product&#038;p=2408"},"modified":"2026-09-28T08:10:47","modified_gmt":"2026-09-28T08:10:47","slug":"microscopio-acustico-a-scansione-standard-sam","status":"publish","type":"product","link":"https:\/\/www.magntek.de\/it\/produkte\/standard-scanning-akustikmikroskop-sam\/","title":{"rendered":"Microscopio acustico a scansione standard (SAM)"},"content":{"rendered":"<table>\n<tbody>\n<tr>\n<td width=\"280\"><strong><b>Denominazione del parametro<\/b><\/strong><\/td>\n<td width=\"330\"><strong><b>Valore specificato<\/b><\/strong><\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Dimensioni complessive<\/b><\/strong><\/td>\n<td width=\"330\">1.070 mm \u00d7 950 mm \u00d7 1.500 mm<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Area di scansione effettiva<\/b><\/strong><\/td>\n<td width=\"330\">400 mm \u00d7 320 mm (personalizzabile in base alle esigenze del cliente)<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Velocit\u00e0 massima di scansione<\/b><\/strong><\/td>\n<td width=\"330\">1.000 mm\/s<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Risoluzione consigliata delle immagini<\/b><\/strong><\/td>\n<td width=\"330\">da 1 a 4.000 \u03bcm\/pixel<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Larghezza di banda di trasmissione\/ricezione degli ultrasuoni<\/b><\/strong><\/td>\n<td width=\"330\">da 1 a 500 MHz<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Piattaforma a tre assi<\/b><\/strong><\/td>\n<td width=\"330\">Piattaforma in granito, motori lineari sugli assi X\/Y, doppio azionamento a portale<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Configurazione della testina di prova<\/b><\/strong><\/td>\n<td width=\"330\">Configurazione singola, doppia o a quattro teste (opzionale)<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Modalit\u00e0 di scansione<\/b><\/strong><\/td>\n<td width=\"330\">C-Scan, B-Scan, A-Scan; supporta la scansione sincrona C+T<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Sistema di alimentazione idrica e di scarico<\/b><\/strong><\/td>\n<td width=\"330\">Alimentazione a pressione idraulica, scarico per gravit\u00e0, scarico con pompa opzionale<\/td>\n<\/tr>\n<tr>\n<td width=\"280\"><strong><b>Dispositivo a tenuta<\/b><\/strong><\/td>\n<td width=\"330\">I dispositivi impermeabili possono essere progettati su misura in base alle specifiche del prodotto<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>","protected":false},"excerpt":{"rendered":"<ul>\n<li>Controllo completo non distruttivo: nessuna distruzione del campione, possibilit\u00e0 di ripetere il controllo in modo efficiente, il pezzo sottoposto a controllo rimane utilizzabile<\/li>\n<li>Ampia banda di frequenza 1\u2013500 MHz: bassa frequenza per una grande profondit\u00e0 di penetrazione e difetti profondi nei moduli IGBT; alta frequenza per un\u2019elevata risoluzione e micropori nei chip package<\/li>\n<li>Scansione della delaminazione multistrato: supporta fino a 1.000 scansioni per strato, adatta a strutture di packaging multistrato complesse<\/li>\n<li>Opzioni multi-testa: configurazione a una, due o quattro teste; le configurazioni a doppia testa sinistra\/destra raddoppiano l\u2019efficienza, mentre la configurazione a quattro teste garantisce un\u2019elevata produttivit\u00e0<\/li>\n<li>Scansione sincrona C+T: una singola scansione fornisce contemporaneamente immagini in modalit\u00e0 a riflessione (C-SAM) e in modalit\u00e0 a trasmissione (SAT)<\/li>\n<li>Piattaforma in granito a basse vibrazioni, portale con motore lineare a doppia azionamento; la precisione di scansione e la velocit\u00e0 sono superiori a quelle dei classici sistemi a guide lineari e mandrini<\/li>\n<\/ul>","protected":false},"featured_media":2409,"template":"","meta":{"_acf_changed":false},"product_brand":[],"product_cat":[15],"product_tag":[],"class_list":["post-2408","product","type-product","status-publish","has-post-thumbnail","product_cat-scanning-acoustic-microscope-sam-sat","first","instock","shipping-taxable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.5 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Standard-Scanning-Akustikmikroskop (SAM) | Magntek<\/title>\n<meta name=\"description\" content=\"Delaminationspr\u00fcfung an IGBT-\/SiC-Modulen, Chip-Packages &amp; K\u00fchlplatten. 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