- Products
- Probe / Transducer
Probe / Transducer
The probe is a key inspection component in Scanning Acoustic Microscope (SAM/SAT) systems. It is responsible for transmitting and receiving high-frequency ultrasonic signals and converting the returned echoes into electrical signals for further analysis and imaging. The probe’s frequency range, sensitivity, and resolution directly influence inspection depth, image quality, and defect detection capability.
The probe is suitable for non-destructive testing of semiconductor packages, power modules, water-cooled plates, composite materials, and other precision components. It enables highly accurate detection of internal defects, delamination, cracks, voids, and structural anomalies.
The probe is suitable for non-destructive testing of semiconductor packages, power modules, water-cooled plates, composite materials, and other precision components. It enables highly accurate detection of internal defects, delamination, cracks, voids, and structural anomalies.
Application Range
Product Advantages
- High Sensitivity Detection
- High-resolution imaging capability
- Wide Application Range
- Stable and Reliable Performance
Technical Specifications
- High-sensitivity ultrasonic inspection
- High-resolution imaging capability
- Multiple frequency options available
- Suitable for non-destructive testing (NDT)
- Long service life
Precise cutting of textiles, films, rubber, composites, tire cord, and similar materials.
Selection and design recommendations based on the customer’s workpiece material, geometry, and process requirements.
Increases or decreases the amplitude supplied by the converter to optimize ultrasonic energy output for different workpieces and processes.
